Spatial Attention-based Segmentation of Spatter Particle Defects from X-ray Computed Tomography for Metal Additive Manufacturing
Published in International Conference on Industrial Computed Tomography (ICT), 2026
A spatial attention-based segmentation model to detect spatter particle defects in X-ray Computed Tomography, improving defect-detection accuracy for quality control in metal additive-manufacturing processes.
Recommended citation: Dong, C., Sarvesan, S., Malcolm, A. A., & Cheng, F. (2026). "Spatial Attention-based Segmentation of Spatter Particle Defects from X-ray Computed Tomography for Metal Additive Manufacturing." International Conference on Industrial Computed Tomography (ICT).
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